Home
|
english
|
Impressum
|
Datenschutz
|
Sitemap
|
KIT
Institut für Mechanik (IFM)
Generalized Closest Point Projection for Contact Analyses: On Existence and Uniqueness for Arbitrary Contact Surfaces
Generalized Closest Point Projection for Contact Analyses: On Existence and Uniqueness for Arbitrary Contact Surfaces
Autor:
A. Konyukhov, K. Schweizerhof
Quelle:
COMPLAS 2007, Barcelona, September 2007